| DOI | Trouver le DOI : https://doi.org/10.1063/1.4872383 |
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| Auteur | Rechercher : Salomons, M.1; Rechercher : Martins, B.V.C.1; Rechercher : Zikovsky, J.1; Rechercher : Wolkow, R.A.1 |
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| Affiliation | - Conseil national de recherches du Canada. Institut national de nanotechnologie
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| Format | Texte, Article |
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| Sujet | Loading; Microscopes; Scanning electron microscopy; Surfaces; Atomic resolution; Automated feedback; Contact formation; Electrical stability; Field ion microscope; Four-probe measurement; Material characterizations; Reproducibilities; Probes |
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| Résumé | We present an ultrahigh vacuum (UHV) three-probe scanning tunneling microscope in which each probe is capable of atomic resolution. A UHV JEOL scanning electron microscope aids in the placement of the probes on the sample. The machine also has a field ion microscope to clean, atomically image, and shape the probe tips. The machine uses bare conductive samples and tips with a homebuilt set of pliers for heating and loading. Automated feedback controlled tip-surface contacts allow for electrical stability and reproducibility while also greatly reducing tip and surface damage due to contact formation. The ability to register inter-tip position by imaging of a single surface feature by multiple tips is demonstrated. Four-probe material characterization is achieved by deploying two tips as fixed current probes and the third tip as a movable voltage probe. © 2014 AIP Publishing LLC. |
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| Date de publication | 2014 |
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| Dans | |
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| Langue | anglais |
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| Publications évaluées par des pairs | Oui |
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| Numéro NPARC | 21272249 |
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| Exporter la notice | Exporter en format RIS |
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| Signaler une correction | Signaler une correction (s'ouvre dans un nouvel onglet) |
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| Identificateur de l’enregistrement | aa3f04a5-1cb4-4436-b6d5-72d065d3051b |
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| Enregistrement créé | 2014-07-23 |
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| Enregistrement modifié | 2020-04-22 |
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