| DOI | Trouver le DOI : https://doi.org/10.1149/05037.0039ecst |
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| Auteur | Rechercher : Lockwood, David J.1 |
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| Affiliation | - Conseil national de recherches du Canada. Science des mesures et étalons
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| Format | Texte, Article |
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| Conférence | PRiME 2012: Pits and Pores 5: A Symposium in Honor of David Lockwood, October 7-12, 2012, Honolulu, Hawaii |
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| Sujet | Experimental determination; Fundamental band gap; Historical account; Nanostructured silicon; Quantum confinement effects; Silicon nano structures; Strong confinement; Ultra-thin structures; Energy gap; Nanocrystalline silicon; Semiconductor quantum wells; Silicon oxides; Amorphous silicon |
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| Résumé | Amongst a number of diverse approaches to engineering efficient light emission in silicon nanostructures, one system that has received considerable attention has been Si/SiO2 quantum wells. Engineering such structures has not been easy, because to observe the desired quantum confinement effects, the quantum well thickness has to be less than 5 nm. Nevertheless, such ultra thin structures have now been produced by a variety of techniques. The SiO 2 layers are amorphous, but the silicon layers can range from amorphous through nanocrystalline to single-crystal form. The fundamental band gap of the quantum wells has been measured primarily by optical techniques and strong confinement effects have been observed. A detailed comparison is made between theoretical and experimental determinations of the band gap in Si/SiO2 quantum wells. The review article is prefaced with a historical account of the Pits and Pores Symposium series and a personal academic history of the author. © The Electrochemical Society. |
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| Date de publication | 2012-12-01 |
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| Langue | anglais |
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| Publications évaluées par des pairs | Oui |
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| Numéro NPARC | 21270070 |
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| Exporter la notice | Exporter en format RIS |
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| Signaler une correction | Signaler une correction (s'ouvre dans un nouvel onglet) |
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| Identificateur de l’enregistrement | b258d324-3f3f-4b91-9420-776e230ae50e |
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| Enregistrement créé | 2013-12-19 |
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| Enregistrement modifié | 2020-04-21 |
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