| DOI | Trouver le DOI : https://doi.org/10.1016/j.ultramic.2012.07.026 |
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| Auteur | Rechercher : Urban, Radovan1; Rechercher : Wolkow, Robert A.1; Rechercher : Pitters, Jason L.1 |
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| Affiliation | - Conseil national de recherches du Canada. Technologies de sécurité et de rupture
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| Format | Texte, Article |
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| Sujet | Nanotip; Field ion microscopy; Gas field ion source |
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| Résumé | Field ion microscopy (FIM) using neon imaging gas was used to evaluate a W(111) nanotip shape during a nitrogen assisted etching and evaporation process. Using appropriate etching parameters a narrow ring of atoms centered about the tip axis appears in a helium generated image. Etching of tungsten atoms continues exclusively on the outside of this well-defined ring. By replacing helium imaging gas with neon, normally inaccessible crystal structure of a tip apex is revealed. Comparison of the original W(111) tip (before etching) and partly etched tip shows no atomic changes at the tip apex revealing extraordinarily spatially selective etching properties of the etching process. This observation is an important step towards a detailed understanding of the nitrogen assisted etching and evaporation process and will lead to better control over atomically defined tip shapes. |
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| Date de publication | 2012-11 |
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| Dans | |
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| Langue | anglais |
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| Publications évaluées par des pairs | Oui |
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| Identificateur | S0304399112001969 |
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| Numéro NPARC | 21268748 |
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| Exporter la notice | Exporter en format RIS |
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| Signaler une correction | Signaler une correction (s'ouvre dans un nouvel onglet) |
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| Identificateur de l’enregistrement | b733ab84-2e5a-40a1-a62e-a989b45cec8f |
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| Enregistrement créé | 2013-11-12 |
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| Enregistrement modifié | 2020-04-21 |
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