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| DOI | Trouver le DOI : https://doi.org/10.1021/acsnano.1c05777 |
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| Auteur | Rechercher : Onoda, Jo1Identifiant ORCID : https://orcid.org/0000-0003-4906-2571; Rechercher : Khademi, Ali2; Rechercher : Wolkow, Robert A.1; Rechercher : Pitters, Jason3 |
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| Affiliation | - University of Alberta
- Conseil national de recherches du Canada. Centre de recherche en métrologie
- Conseil national de recherches du Canada. Nanotechnologie
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| Format | Texte, Article |
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| Sujet | scanning tunneling microscopy; multiprobe; two-probe; Ohmic contact; two-dimensional conduction; nanofabricated structures; silicon |
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| Résumé | We used multiprobe scanning tunneling microscope (STM) to fabricate and electrically characterize nanostructures on Si surfaces. We overcame resistive contacts by using field evaporation to clean tip apexes in order to create Ohmic contact with the Si surface states on a Si substrate. A two-probe (2P-) STM with Ohmic contact allowed for measurement at very low bias, limiting conduction through space-charge layer and bulk states. The Ohmic 2P-STM measurement clarified the surface conductivity of the Si(111)-(7 × 7) surface. We also confirmed that Ohmic 2P-STM can be replaced with more convenient Ohmic one-probe STM for the conductance measurements on the Si surface. We prepared nanostructures using STM lithography to define electronically isolated two-dimensional (2D) regions with various aspect ratios. Their surface conduction properties are described well by the conventional sheet model, proving the diffusive 2D conduction on the Si surface. Constrictions and breaks in 2D structures were also evaluated. Ohmic 2P-STM will be helpful for the investigation of exploratory atomic-scale circuitry or cutting-edge materials sciences. |
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| Date de publication | 2021-11-15 |
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| Maison d’édition | American Chemical Society |
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| Dans | |
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| Langue | anglais |
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| Publications évaluées par des pairs | Oui |
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| Numéro du CNRC | NRC-NANO-169 |
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| Exporter la notice | Exporter en format RIS |
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| Signaler une correction | Signaler une correction (s'ouvre dans un nouvel onglet) |
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| Identificateur de l’enregistrement | cdc2a3a6-14dd-495f-8f4d-6390c90129c2 |
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| Enregistrement créé | 2023-02-03 |
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| Enregistrement modifié | 2023-02-03 |
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