DOI | Trouver le DOI : https://doi.org/10.1063/1.357742 |
---|
Auteur | Rechercher : Aers, Geoffrey1 |
---|
Affiliation | - Conseil national de recherches du Canada
|
---|
Format | Texte, Article |
---|
Sujet | backscattering; computerized simulation; depth profiles; KEV range; Monte Carlo Method; multilayers; positrons; scaling laws; stopping power |
---|
Résumé | It is shown that the results of lengthy Monte Carlo simulations for positron stopping profiles in multilayer systems can be reproduced accurately in the incident energy range 1–25 keV using a simple scaling model. This model takes into account the variation of mean implantation depth between layers and the backscattering effects of interfaces and represents a computation time saving of several orders of magnitude. This development is a significant step in the effort to make detailed multilayer defect profiling with positrons a practical possibility. |
---|
Date de publication | 1994-08-01 |
---|
Dans | |
---|
Numéro NPARC | 12328122 |
---|
Exporter la notice | Exporter en format RIS |
---|
Signaler une correction | Signaler une correction (s'ouvre dans un nouvel onglet) |
---|
Identificateur de l’enregistrement | de84810f-b96e-4ee8-af10-44f376598d20 |
---|
Enregistrement créé | 2009-09-10 |
---|
Enregistrement modifié | 2020-04-27 |
---|