| DOI | Trouver le DOI : https://doi.org/10.1063/1.357742 |
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| Auteur | Rechercher : Aers, Geoffrey1 |
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| Affiliation | - Conseil national de recherches Canada
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| Format | Texte, Article |
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| Sujet | backscattering; computerized simulation; depth profiles; KEV range; Monte Carlo Method; multilayers; positrons; scaling laws; stopping power |
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| Résumé | It is shown that the results of lengthy Monte Carlo simulations for positron stopping profiles in multilayer systems can be reproduced accurately in the incident energy range 1–25 keV using a simple scaling model. This model takes into account the variation of mean implantation depth between layers and the backscattering effects of interfaces and represents a computation time saving of several orders of magnitude. This development is a significant step in the effort to make detailed multilayer defect profiling with positrons a practical possibility. |
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| Date de publication | 1994-08-01 |
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| Dans | |
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| Numéro NPARC | 12328122 |
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| Exporter la notice | Exporter en format RIS |
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| Signaler une correction | Signaler une correction (s'ouvre dans un nouvel onglet) |
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| Identificateur de l’enregistrement | de84810f-b96e-4ee8-af10-44f376598d20 |
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| Enregistrement créé | 2009-09-10 |
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| Enregistrement modifié | 2020-04-27 |
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