Characterizing the rate and coherence of single-electron tunneling between two dangling bonds on the surface of silicon

From National Research Council Canada

DOIResolve DOI: https://doi.org/10.1103/PhysRevB.89.035315
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  1. National Research Council of Canada. National Institute for Nanotechnology
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LanguageEnglish
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NPARC number21272219
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Record identifier09ea74c3-5efd-4f30-be97-996278b4d3ec
Record created2014-07-23
Record modified2020-04-22
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