Structural changes in amorphous silicon studied by X-ray photoemission spectroscopy: a phenomenon 109, independent of the Staebler-Wronski effect?
Structural changes in amorphous silicon studied by X-ray photoemission spectroscopy: a phenomenon 109, independent of the Staebler-Wronski effect?
| DOI | Resolve DOI: https://doi.org/10.1016/S0022-3093(01)00339-8 |
|---|---|
| Author | Search for: ; Search for: ; Search for: |
| Format | Text, Article |
| Publication date | 2001 |
| In | |
| NPARC number | 12743934 |
| Export citation | Export as RIS |
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| Record identifier | 0c3f673d-66dc-40aa-9b63-057b4226ba69 |
| Record created | 2009-10-27 |
| Record modified | 2020-03-27 |
- Date modified: