Structural changes in amorphous silicon studied by X-ray photoemission spectroscopy: a phenomenon 109, independent of the Staebler-Wronski effect?
Structural changes in amorphous silicon studied by X-ray photoemission spectroscopy: a phenomenon 109, independent of the Staebler-Wronski effect?
DOI | Resolve DOI: https://doi.org/10.1016/S0022-3093(01)00339-8 |
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Format | Text, Article |
Publication date | 2001 |
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NPARC number | 12743934 |
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Record identifier | 0c3f673d-66dc-40aa-9b63-057b4226ba69 |
Record created | 2009-10-27 |
Record modified | 2020-03-27 |
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