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Fourier transform technique with frequency filtering for optical thin-film design

From National Research Council Canada

DOIResolve DOI: https://doi.org/10.1364/AO.34.000688
AuthorSearch for: 1
Affiliation
  1. National Research Council Canada. NRC Institute for Microstructural Sciences
FormatText, Article
Abstract
A Fourier analysis of existing and potentially complex refractive index profiles is often useful in the resolution of thin-film design problems. Applications of a frequency-filtering technique, which consists of the suppression of undesired spatial frequencies from the refractive index profiles, are described. A new, extremely simple antireflection coating synthesis method based on this concept is proposed.
Publication date
In
  • Applied Optics 34, no. 4 (1 February 1995): 688–694.
LanguageEnglish
NPARC number12330248
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Record identifier1c764e78-fd0f-4de9-9183-714ecfb59c8f
Record created2009-09-10
Record modified2020-04-29
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