| DOI | Resolve DOI: https://doi.org/10.1063/1.4886598 |
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| Author | Search for: Mala, S. A.; Search for: Tsybeskov, L.; Search for: Lockwood, D. J.1; Search for: Wu, X.2; Search for: Baribeau, J.-M.2 |
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| Affiliation | - National Research Council of Canada. Measurement Science and Standards
- National Research Council of Canada. Information and Communication Technologies
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| Format | Text, Article |
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| Subject | Germanium; Phonons; Raman spectra; Raman scattering; Thermal conductivity |
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| Abstract | We present a quantitative analysis of Raman scattering in various Si/Si1-xGex multilayered nanostructures with well-defined Ge composition (x) and layer thicknesses. Using Raman and transmission electron microscopy data, we discuss and model Si/SiGe intermixing and strain. By analyzing Stokes and anti-Stokes Raman signals, we calculate temperature and discuss heat dissipation in the samples under intense laser illumination. |
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| Publication date | 2014-07-02 |
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| In | |
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| Language | English |
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| Peer reviewed | Yes |
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| NPARC number | 21272773 |
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| Export citation | Export as RIS |
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| Report a correction | Report a correction (opens in a new tab) |
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| Record identifier | 20665cc4-b9c8-4b5b-a19c-1a5e81424733 |
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| Record created | 2014-12-03 |
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| Record modified | 2020-04-22 |
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