Origin of bright field TEM contrast enhancement by a hole-free phase plate
Origin of bright field TEM contrast enhancement by a hole-free phase plate
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Affiliation |
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Format | Text, Address |
Conference | 17th International Microscopy Congress, September 2010, Rio de Janeiro, Brazil |
Publication date | 2010-09 |
Publisher | International Federation of Societies for Microscopy |
Language | English |
Export citation | Export as RIS |
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Record identifier | 21de7cae-4a9f-43f2-ab7b-cdfde839f048 |
Record created | 2021-09-03 |
Record modified | 2021-09-14 |
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