Origin of hole free phase plate image contrast in a TEM

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Affiliation
  1. National Research Council of Canada. Nanotechnology
FormatText, Article
Conference73rd meeting of the Japanese Society of Microscopy, May 30 – June 1, 2017, Sapporo, Japan
Publication date
PublisherJapanese Society of Microscopy
In
LanguageEnglish
Peer reviewedYes
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Record identifier241dd1fe-cbfe-4b46-b7ae-cd82be252662
Record created2021-08-25
Record modified2021-08-25
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