| DOI | Resolve DOI: https://doi.org/10.1016/j.physb.2004.03.056 |
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| Author | Search for: Liu, Y.; Search for: Fritzsche, Helmut1; Search for: Hauschild, J.; Search for: Maletta, H. |
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| Affiliation | - National Research Council Canada. NRC Canadian Neutron Beam Centre
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| Format | Text, Article |
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| Subject | Magnetization; Polarized neutron reflectometry; Thin films; X-ray reflectometry |
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| Abstract | The magnetic properties of ultrathin Fe (1-0-0) films were investigated by polarized neutron reflectometry (PNR). Fe films with different thicknesses from 1 to 3?nm were prepared by Molecular Beam Epitaxy (MBE) on a V buffer layer, which was deposited on a MgO (1-0-0) single crystal. In order to avoid oxidation the Fe films were covered with V capping layers. During the preparation process the growth of the films was monitored by low-energy electron diffraction (LEED) and Auger electron spectroscopy (AES). Combining the information obtained from PNR with X-ray reflectometry (XRR), the thicknesses of the Fe and V layers were determined precisely. From PNR measurements the absolute value of the magnetization of the films could be determined by fitting the spin-up and spin-down neutron reflectivities separately. The magnetic moments of the Fe films show a perfect linear dependence on the film thickness tFe. The fitting line intersects the abscissa at tFe=(0.1?0.01)?nm. This means that the magnetic properties of the two V/Fe interfaces show up as a constant reduction of the magnetic moment equal to an Fe bulk layer of thickness tFe=(0.1?0.01)?nm. |
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| Publication date | 2004-07-15 |
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| In | |
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| NPARC number | 12328880 |
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| Export citation | Export as RIS |
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| Report a correction | Report a correction (opens in a new tab) |
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| Record identifier | 2d742608-d113-4a7f-835b-37093c604750 |
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| Record created | 2009-09-10 |
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| Record modified | 2020-04-17 |
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