| DOI | Trouver le DOI : https://doi.org/10.1016/j.physb.2004.03.056 |
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| Auteur | Rechercher : Liu, Y.; Rechercher : Fritzsche, Helmut1; Rechercher : Hauschild, J.; Rechercher : Maletta, H. |
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| Affiliation | - Conseil national de recherches du Canada. Centre canadien de faisceaux de neutrons du CNRC
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| Format | Texte, Article |
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| Sujet | Magnetization; Polarized neutron reflectometry; Thin films; X-ray reflectometry |
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| Résumé | The magnetic properties of ultrathin Fe (1-0-0) films were investigated by polarized neutron reflectometry (PNR). Fe films with different thicknesses from 1 to 3?nm were prepared by Molecular Beam Epitaxy (MBE) on a V buffer layer, which was deposited on a MgO (1-0-0) single crystal. In order to avoid oxidation the Fe films were covered with V capping layers. During the preparation process the growth of the films was monitored by low-energy electron diffraction (LEED) and Auger electron spectroscopy (AES). Combining the information obtained from PNR with X-ray reflectometry (XRR), the thicknesses of the Fe and V layers were determined precisely. From PNR measurements the absolute value of the magnetization of the films could be determined by fitting the spin-up and spin-down neutron reflectivities separately. The magnetic moments of the Fe films show a perfect linear dependence on the film thickness tFe. The fitting line intersects the abscissa at tFe=(0.1?0.01)?nm. This means that the magnetic properties of the two V/Fe interfaces show up as a constant reduction of the magnetic moment equal to an Fe bulk layer of thickness tFe=(0.1?0.01)?nm. |
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| Date de publication | 2004-07-15 |
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| Dans | |
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| Numéro NPARC | 12328880 |
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| Exporter la notice | Exporter en format RIS |
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| Signaler une correction | Signaler une correction (s'ouvre dans un nouvel onglet) |
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| Identificateur de l’enregistrement | 2d742608-d113-4a7f-835b-37093c604750 |
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| Enregistrement créé | 2009-09-10 |
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| Enregistrement modifié | 2020-04-17 |
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