Download | - View final version: Anti-reflection subwavelength gratings for InP-based waveguide facets (PDF, 3.1 MiB)
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DOI | Resolve DOI: https://doi.org/10.1364/OL.431353 |
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Author | Search for: Puts, LukasORCID identifier: https://orcid.org/0000-0001-5416-3006; Search for: Leijtens, XaveerORCID identifier: https://orcid.org/0000-0001-7794-8236; Search for: Cheben, Pavel1ORCID identifier: https://orcid.org/0000-0003-4232-9130; Search for: Schmid, Jens1; Search for: Reniers, Sander; Search for: Melati, Daniele1ORCID identifier: https://orcid.org/0000-0002-3427-0186 |
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Affiliation | - National Research Council of Canada. Advanced Electronics and Photonics
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Format | Text, Article |
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Abstract | We demonstrate the anti-reflection properties of lithographically defined subwavelength gratings applied to the facets of integrated waveguides realized in the InP membrane-on-silicon platform. The subwavelength gratings are based on the gradient index effect to create a smooth index transition between the core material and air, making it possible to obtain reflections below −30dB at a wavelength of 1550 nm for both TE and TM polarized modes, as shown by 3D finite-difference time-domain simulations. Characterizations performed using Mach–Zehnder interferometers as test structures show relative reflections as low as −25dB, confirming the effectiveness of the technique. |
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Publication date | 2021-07-28 |
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Publisher | Optica Publishing Group |
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In | |
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Language | English |
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Peer reviewed | Yes |
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Export citation | Export as RIS |
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Report a correction | Report a correction (opens in a new tab) |
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Record identifier | 2e177e54-2440-4d66-b3cf-86fbe7906ea1 |
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Record created | 2022-09-16 |
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Record modified | 2022-09-16 |
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