In-situ Monitoring of Residual Stress Development During E-Beam Processing - ABSTRACT ONLY
In-situ Monitoring of Residual Stress Development During E-Beam Processing - ABSTRACT ONLY
Author | Search for: 1; Search for: 1; Search for: 2; Search for: 3 |
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Affiliation |
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Format | Text, Article |
Conference | SAMPE 2004 - 49th International SAMPE Symposium From 5/18/2004 To 5/20/2004, Long Beach, CA |
Subject | Composites; Polymers; Electron Beam Curing; Process Modelling |
Access condition |
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Peer reviewed | Yes |
NRC number | SMPL-2003-0292 |
NPARC number | 8933344 |
Export citation | Export as RIS |
Report a correction | Report a correction (opens in a new tab) |
Record identifier | 2f3d4102-3daf-44bc-bf0e-d33fee67735e |
Record created | 2009-04-23 |
Record modified | 2020-04-16 |
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