Atomic defects of the hydrogen-terminated silicon surface imaged with nc-AFM
Atomic defects of the hydrogen-terminated silicon surface imaged with nc-AFM
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Format | Text, Abstract |
Conference | APS March Meeting 2020, March 2-6, 2020, Denver, Colorado |
Physical description | 1 p. |
Abstract | |
Publication date | 2020-03-02 |
Publisher | American Physical Society |
In | |
Language | English |
Peer reviewed | Yes |
NRC publication | This is a non-NRC publication"Non-NRC publications" are publications authored by NRC employees prior to their employment by NRC. |
NRC number | NRC-NANO-066 |
Export citation | Export as RIS |
Report a correction | Report a correction (opens in a new tab) |
Record identifier | 3402e425-09f7-4dc5-9df5-ccf7bc78f762 |
Record created | 2021-02-04 |
Record modified | 2021-02-12 |
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