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Technique for fitting complex probes in nano-beam diffraction

From National Research Council Canada

DOIResolve DOI: https://doi.org/10.1017/S143192760909494X
AuthorSearch for: 1; Search for: 1
Affiliation
  1. National Research Council of Canada. National Institute for Nanotechnology
FormatText, Article
ConferenceMicroscopy and Microanalysis 2009, 26-30 July 2009, Richmond, Virginia, USA
Publication date
In
  • Microscopy and Microanalysis 15, no. Supplement S2 (July 2009): 768–769.
LanguageEnglish
Peer reviewedYes
NPARC number21268177
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Record identifier3bd6afec-7867-4144-9a37-8da54b6da889
Record created2013-05-21
Record modified2020-04-16
Date modified: