Direct imaging of the depletion region of an InP pn junction under bias using scanning voltage microscopy
Direct imaging of the depletion region of an InP pn junction under bias using scanning voltage microscopy
| DOI | Resolve DOI: https://doi.org/10.1063/1.1528277 |
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| Author | Search for: ; Search for: ; Search for: ; Search for: ; Search for: 1; Search for: ; Search for: ; Search for: |
| Affiliation |
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| Format | Text, Article |
| Publication date | 2002 |
| In | |
| Language | English |
| Peer reviewed | Yes |
| NPARC number | 12744750 |
| Export citation | Export as RIS |
| Report a correction | Report a correction (opens in a new tab) |
| Record identifier | 42003d2c-25a0-447c-aa44-1baca85c6dbb |
| Record created | 2009-10-27 |
| Record modified | 2023-05-10 |
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