Direct imaging of the depletion region of an InP pn junction under bias using scanning voltage microscopy

From National Research Council Canada

DOIResolve DOI: https://doi.org/10.1063/1.1528277
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Affiliation
  1. National Research Council of Canada. NRC Institute for Microstructural Sciences
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LanguageEnglish
Peer reviewedYes
NPARC number12744750
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Record identifier42003d2c-25a0-447c-aa44-1baca85c6dbb
Record created2009-10-27
Record modified2023-05-10
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