Scanning tunneling microscopy images of IIIV semiconductor alloys: strain effects
Scanning tunneling microscopy images of IIIV semiconductor alloys: strain effects
DOI | Resolve DOI: https://doi.org/10.1116/1.1529651 |
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Format | Text, Article |
Publication date | 2003 |
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NPARC number | 12744628 |
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Record identifier | 42ca7a48-84ae-449f-bdf0-b8382f3bc569 |
Record created | 2009-10-27 |
Record modified | 2020-04-02 |
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