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Growth and characterization of Si---Ge atomic layer superlattices

From National Research Council Canada

DOIResolve DOI: https://doi.org/10.1016/0040-6090(89)90425-2
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FormatText, Article
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In
  • Thin solid films 183, no. December 30, (1989): 17–24.
LanguageEnglish
NRC numberNRC-INMS-1118
NPARC number8897217
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Record identifier4343091b-e661-4e53-821f-b191a857bfd0
Record created2009-04-22
Record modified2020-03-17
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