| DOI | Resolve DOI: https://doi.org/10.1017/S1431927610058630 |
|---|
| Author | Search for: Zhang, Huairuo1; Search for: Egerton, Ray F.1; Search for: Malac, Marek1 |
|---|
| Affiliation | - National Research Council of Canada
|
|---|
| Format | Text, Article |
|---|
| Conference | Microscopy and Microanalysis 2010, August 1–5, 2010, Portland, Oregon |
|---|
| Abstract | Thickness measurement of nanoscale objects is critical in many applications but when the thickness to be measured falls below about 10 nm, the usual methods of conventional transmission electron microscopy (CTEM) are of limited use. |
|---|
| Publication date | 2010-07-01 |
|---|
| Publisher | Cambridge University Press |
|---|
| In | |
|---|
| Language | English |
|---|
| Peer reviewed | Yes |
|---|
| Export citation | Export as RIS |
|---|
| Report a correction | Report a correction (opens in a new tab) |
|---|
| Record identifier | 44609ed2-8d2a-4920-9ca7-a3ae765f9b54 |
|---|
| Record created | 2020-05-28 |
|---|
| Record modified | 2020-05-28 |
|---|
