Porous Semiconductor Micropatterns Formed on Focussed Ion Beam Implants
Porous Semiconductor Micropatterns Formed on Focussed Ion Beam Implants
DOI | Resolve DOI: https://doi.org/10.1023/A:1009655324979 |
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Format | Text, Article |
Publication date | 2000 |
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NPARC number | 12744888 |
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Record identifier | 44e174f6-7449-40c1-854a-e2e4eaa60e44 |
Record created | 2009-10-27 |
Record modified | 2020-03-26 |
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