Porous Semiconductor Micropatterns Formed on Focussed Ion Beam Implants

From National Research Council Canada

DOIResolve DOI: https://doi.org/10.1023/A:1009655324979
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  1. National Research Council of Canada. NRC Institute for Microstructural Sciences
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NPARC number12744888
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Record identifier44e174f6-7449-40c1-854a-e2e4eaa60e44
Record created2009-10-27
Record modified2020-03-26
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