| DOI | Resolve DOI: https://doi.org/10.1017/S1431927614002876 |
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| Author | Search for: Malac, Marek1; Search for: Beleggia, Marco; Search for: Egerton, Ray1; Search for: Kawasaki, Masahiro; Search for: Berge, Michael1; Search for: Okura, Yoshio; Search for: Ishikawa, Isamu; Search for: Motoki, Kohei |
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| Affiliation | - National Research Council of Canada
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| Format | Text, Article |
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| Conference | Microscopy & Microanalysis 2014, August 3-7, 2014, Hartford, Connecticut, United States |
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| Abstract | Electrostatic charging of samples under electron beam irradiation in a TEM affects the observed contrast [1]. It can also be used to produce Zernike-like phase contrast when a suitable uniform thin film is placed in the back focal plane of the objective lens, referred to as a hole-free phase plate (HFPP) contrast [2]. Here we report the effect of heating and biasing on contrast transfer function. Our results may be relevant to sample charging and other implementations of thin-film type phase plates. |
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| Publication date | 2014-08-27 |
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| Publisher | Cambridge University Press |
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| In | |
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| Language | English |
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| Peer reviewed | Yes |
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| Export citation | Export as RIS |
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| Report a correction | Report a correction (opens in a new tab) |
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| Record identifier | 49a6ea45-f355-4f45-bd59-341da0ed0401 |
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| Record created | 2020-02-29 |
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| Record modified | 2024-05-15 |
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