| DOI | Resolve DOI: https://doi.org/10.1017/S1431927614010666 |
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| Author | Search for: Cui, Kai1; Search for: Bosnick, Ken1; Search for: Indoe, Rob1; Search for: Malac, Marek1 |
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| Affiliation | - National Research Council of Canada
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| Format | Text, Article |
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| Conference | Microscopy & Microanalysis 2014, August 3-7, 2014, Hartford, Connecticut, United States |
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| Abstract | Graphene appears to be a material with many potential applications. A robust and convenient method is therefore needed to evaluate the quality of graphene films. Raman spectroscopy is often used and is fast and inexpensive; however, the information content in the Raman spectrum is limited. We demonstrate an electron diffraction based method that can be routinely used to evaluate the quality of graphene thin films. |
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| Publication date | 2014-08-27 |
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| Publisher | Cambridge University Press |
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| In | |
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| Language | English |
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| Peer reviewed | Yes |
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| Export citation | Export as RIS |
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| Report a correction | Report a correction (opens in a new tab) |
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| Record identifier | 5543d2bc-a500-4a6c-b006-8b35d1109e31 |
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| Record created | 2020-02-29 |
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| Record modified | 2024-05-15 |
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