Charging of carbon thin films in scanning and phase-plate transmission electron microscopy

From National Research Council Canada

DOIResolve DOI:
AuthorSearch for: ; Search for: 1; Search for: ; Search for: ; Search for: ; Search for: ; Search for: ; Search for:
Name affiliation
  1. National Research Council of Canada. Nanotechnology
FormatText, Article
Subjectscanning transmission electron microscopy; transmission electron microscopy; electron-beam induced charging; thin film; phase plate; radiation damage; hole-free phase plate; volta phase plate
Publication date
Peer reviewedYes
NPARC number23002641
Export citationExport as RIS
Report a correctionReport a correction (opens in a new tab)
Record identifier60bf43bb-8525-4626-98a4-d8506d30fe51
Record created2017-12-08
Record modified2020-03-16
Date modified: