DOI | Trouver le DOI : https://doi.org/10.1016/j.ultramic.2017.09.009 |
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Auteur | Rechercher : Hettler, Simon; Rechercher : Kano, Emi1; Rechercher : Dries, Manuel; Rechercher : Gerthsen, Dagmar; Rechercher : Pfaffmann, Lukas; Rechercher : Bruns, Michael; Rechercher : Beleggia, Marco; Rechercher : Malac, Marek |
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Affiliation du nom | - Conseil national de recherches du Canada. Nanotechnologie
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Format | Texte, Article |
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Sujet | scanning transmission electron microscopy; transmission electron microscopy; electron-beam induced charging; thin film; phase plate; radiation damage; hole-free phase plate; volta phase plate |
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Résumé | A systematic study on charging of carbon thin films under intense electron-beam irradiation was performed in a transmission electron microscope to identify the underlying physics for the functionality of hole-free phase plates. Thin amorphous carbon films fabricated by different deposition techniques and single-layer graphene were studied. Clean thin films at moderate temperatures show small negative charging while thin films kept at an elevated temperature are stable and not prone to beam-generated charging. The charging is attributed to electron-stimulated desorption (ESD) of chemisorbed water molecules from the thin-film surfaces and an accompanying change of work function. The ESD interpretation is supported by experimental results obtained by electron-energy loss spectroscopy, hole-free phase plate imaging, secondary electron detection and x-ray photoelectron spectroscopy as well as simulations of the electrostatic potential distribution. The described ESD-based model explains previous experimental findings and is of general interest to any phase-related technique in a transmission electron microscope. |
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Date de publication | 2017-09-28 |
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Maison d’édition | Elsevier |
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Dans | |
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Langue | anglais |
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Publications évaluées par des pairs | Oui |
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Numéro NPARC | 23002641 |
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Exporter la notice | Exporter en format RIS |
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Signaler une correction | Signaler une correction (s'ouvre dans un nouvel onglet) |
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Identificateur de l’enregistrement | 60bf43bb-8525-4626-98a4-d8506d30fe51 |
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Enregistrement créé | 2017-12-08 |
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Enregistrement modifié | 2020-03-16 |
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