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Development of environmental specimen holder for Hitachi S-5500 UHR SEM microscope

From National Research Council Canada

DOIResolve DOI: https://doi.org/10.1017/S1431927611003047
AuthorSearch for: 1; Search for: ; Search for: 1; Search for: 1; Search for: ; Search for: 1
Affiliation
  1. National Research Council Canada
FormatText, Article
ConferenceMicroscopy & Microanalysis 2011, August 7-11, 2011, Nashville, Tennessee, United States
Abstract
Environmental electron microscopy allows samples and processes to be studied in-situ in a gaseous environment. In many cases a sample can be examined in an essentially natural state. There are sev-eral options available to conduct in-situ investigations. One route is to use a dedicated environmental SEM or TEM instrument while another is to use a specially designed environment holder separating the high vacuum of the electron microscope from the sample by thin membranes.
Publication date
PublisherCambridge University Press
In
  • Microscopy and Microanalysis 17, no. S2 (11 August 2011): 434–435.
LanguageEnglish
Peer reviewedYes
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Record identifier645aa910-2780-462d-af17-29f9c4d68f1d
Record created2020-03-10
Record modified2024-05-15
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