DOI | Resolve DOI: https://doi.org/10.1017/S1431927611003047 |
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Author | Search for: Dogel, S1; Search for: Hoyle, D; Search for: Malac, M1; Search for: Salomons, M1; Search for: Mitsuhiro, N; Search for: Wolkow, R1 |
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Affiliation | - National Research Council of Canada
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Format | Text, Article |
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Conference | Microscopy & Microanalysis 2011, August 7-11, 2011, Nashville, Tennessee, United States |
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Abstract | Environmental electron microscopy allows samples and processes to be studied in-situ in a gaseous environment. In many cases a sample can be examined in an essentially natural state. There are sev-eral options available to conduct in-situ investigations. One route is to use a dedicated environmental SEM or TEM instrument while another is to use a specially designed environment holder separating the high vacuum of the electron microscope from the sample by thin membranes. |
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Publication date | 2011-08-11 |
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Publisher | Cambridge University Press |
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In | |
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Language | English |
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Peer reviewed | Yes |
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Export citation | Export as RIS |
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Report a correction | Report a correction (opens in a new tab) |
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Record identifier | 645aa910-2780-462d-af17-29f9c4d68f1d |
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Record created | 2020-03-10 |
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Record modified | 2024-05-15 |
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