Ellipsometric Characterization of the Optical Constants of Metals: Thin Film vs Nanoparticle
Ellipsometric Characterization of the Optical Constants of Metals: Thin Film vs Nanoparticle
Alternative title | Metallization of Polymers 2 |
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Author | Search for: 1; Search for: |
Editor | Search for: Sacher, E. |
Affiliation |
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Format | Text, Article |
Publication date | 2002 |
Publisher | Plenum Press |
NPARC number | 12346775 |
Export citation | Export as RIS |
Report a correction | Report a correction (opens in a new tab) |
Record identifier | 66e4cc8e-b6c9-44d8-b755-931358b9ec13 |
Record created | 2009-09-17 |
Record modified | 2020-03-30 |
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