Photodegradation versus hot-electron impact for electrical tree inception at low electric fields
Photodegradation versus hot-electron impact for electrical tree inception at low electric fields
| DOI | Resolve DOI: https://doi.org/10.1109/ICPADM.1991.172352 |
|---|---|
| Author | Search for: ; Search for: ; Search for: ; Search for: |
| Sponsor | Search for: IEEE; Search for: ICPADM |
| Format | Text, Article |
| Conference | Proceedings of the 3rd International Conference on Properties and Applications of Dielectric Materials, July 8-12, 1991, Tokyo, Japan |
| ISBN | 0879425687 |
| Language | English |
| NRC number | NRC-INMS-1746 |
| NPARC number | 8897093 |
| Export citation | Export as RIS |
| Report a correction | Report a correction (opens in a new tab) |
| Record identifier | 70a96f9e-bca0-49e3-8a99-ea8731d4657d |
| Record created | 2009-04-22 |
| Record modified | 2020-04-16 |
- Date modified: