Electron microscopy characterization at NINT
Electron microscopy characterization at NINT
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Affiliation |
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Format | Text, Address |
Conference | 34th Annual Meeting of the Microscopical Society of Canada, June 12–15, 2007, Edmonton, Alberta, Canada |
Publication date | 2007-06-15 |
Publisher | Microscopical Society of Canada |
Language | English |
Export citation | Export as RIS |
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Record identifier | 785317af-51dd-46b5-8ec6-84656760be84 |
Record created | 2021-09-20 |
Record modified | 2021-09-20 |
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