Stress distribution in patterned-substrate InGaAs/InP

From National Research Council Canada

Alternative titleSPIE
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Affiliation
  1. National Research Council of Canada. NRC Institute for Microstructural Sciences
FormatText, Article
ConferenceSPIE Optoelectronics Materials and Devices II, 2000, Taipei
NPARC number12346219
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Record identifier878cd159-8c93-4580-b0e5-a46fb592af51
Record created2009-09-17
Record modified2020-04-16
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