Stress distribution in patterned-substrate InGaAs/InP
Stress distribution in patterned-substrate InGaAs/InP
| Alternative title | SPIE |
|---|---|
| Author | Search for: ; Search for: 1; Search for: 1; Search for: 1 |
| Affiliation |
|
| Format | Text, Article |
| Conference | SPIE Optoelectronics Materials and Devices II, 2000, Taipei |
| NPARC number | 12346219 |
| Export citation | Export as RIS |
| Report a correction | Report a correction (opens in a new tab) |
| Record identifier | 878cd159-8c93-4580-b0e5-a46fb592af51 |
| Record created | 2009-09-17 |
| Record modified | 2020-04-16 |
Page details
From:
- Date modified: