Simultaneous multiple file EXAFS analysis: methodology and application to buried Ge–Si interfaces

From National Research Council Canada

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  1. National Research Council of Canada. NRC Institute for Microstructural Sciences
FormatText, Article
ConferenceXAFS VII, the 7th International Conference on X-ray Absorption Fine Structure, August 23-29, 1992, Kobe, Japan
SubjectEXAFS; multi-file analysis; Si-Ge interface; atomic-layer superlattices; epitaxy
Publication date
PublisherIOP Publishing
Peer reviewedYes
NPARC number23000867
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