Surface relaxations, current enhancements, and absolute distances in high resolution scanning tunneling microscopy
Surface relaxations, current enhancements, and absolute distances in high resolution scanning tunneling microscopy
DOI | Resolve DOI: https://doi.org/10.1103/PhysRevLett.87.236104 |
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Format | Text, Article |
Abstract | |
Publication date | 2001-12 |
In | |
Language | English |
NRC publication | This is a non-NRC publication"Non-NRC publications" are publications authored by NRC employees prior to their employment by NRC. |
NPARC number | 12339030 |
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Record identifier | 883598e5-d34c-4c2f-b4d4-f0cdb30bd102 |
Record created | 2009-09-11 |
Record modified | 2020-03-27 |
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