| DOI | Resolve DOI: https://doi.org/10.1063/1.3153954 |
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| Author | Search for: Matsik, S. G.; Search for: Jayasinghe, R. C.; Search for: Weerasekara, A. B.; Search for: Perera, A. G. U.; Search for: Linfield, E. H.; Search for: Khanna, S. P.; Search for: Lachab, M.; Search for: Liu, H. C.1 |
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| Affiliation | - National Research Council of Canada. NRC Institute for Microstructural Sciences
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| Format | Text, Article |
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| Abstract | Results are presented showing the effect of emitter layer thickness on the shape of the spectral response of heterojunction interfacial workfunction internal photoemission detectors. The results confirm that thicker emitters increase the response at shorter wavelengths. A model is developed to explain the experimentally observed blueshift in the peak wavelength with increased emitter thickness, using a combination of hot-cold carrier scattering and phonon emission processes. The study provides a tool for designing detectors exhibiting different peak responses, as demonstrated by evaluating the design parameters for the 8–14μm spectral range. |
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| Publication date | 2009-07 |
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| Publisher | AIP Publishing |
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| In | |
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| Language | English |
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| Peer reviewed | Yes |
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| NPARC number | 23004757 |
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| Export citation | Export as RIS |
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| Report a correction | Report a correction (opens in a new tab) |
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| Record identifier | 8d14dfbc-2f72-4da6-b608-21d14342f6e6 |
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| Record created | 2018-12-17 |
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| Record modified | 2020-04-16 |
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