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Measuring and Modeling the Scaling Trend of the RF Noise in MOSFETs

From National Research Council Canada

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Affiliation
  1. National Research Council Canada. NRC Institute for Microstructural Sciences
FormatText, Article
Conference64th IEEE Device Research Conference, 2006
NPARC number12346594
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Record identifier8e8b809f-8e05-4aa3-bec7-338ddbb9f440
Record created2009-09-17
Record modified2020-04-16
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