| DOI | Resolve DOI: https://doi.org/10.1364/CLEO_SI.2019.SF3G.2 |
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| Author | Search for: Godfrey, Alan T. K.1; Search for: Kallepalli, L. N. Deepak1; Search for: Ratté, Jesse J.1; Search for: Corkum, Paul B.1 |
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| Affiliation | - National Research Council of Canada. Security and Disruptive Technologies
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| Format | Text, Article |
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| Conference | CLEO: Science and Innovations, May 5-10, 2019, San Jose, California |
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| Abstract | We present the phenomenology of blister formation by nonlinear absorption of femtosecond pulses in polyimide films, characterized by atomic force microscopy. We demonstrate a novel implementation of blisters as microlenses. |
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| Publication date | 2019-05-10 |
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| Publisher | OSA |
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| In | |
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| Series | |
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| Language | English |
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| Peer reviewed | Yes |
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| Export citation | Export as RIS |
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| Report a correction | Report a correction (opens in a new tab) |
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| Record identifier | 942cfec9-63a5-4524-8a46-8e923e1b1859 |
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| Record created | 2021-04-19 |
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| Record modified | 2021-04-22 |
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