| Download | - View author's version: Origin of spurious intensity in vacuum near sample edge in bright field TEM images (PDF, 3.3 MiB)
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| DOI | Resolve DOI: https://doi.org/10.1016/j.micron.2022.103348 |
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| Author | Search for: Hayashida, Misa1; Search for: Malac, Marek1; Search for: Yamasaki, Jun |
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| Affiliation | - National Research Council of Canada. Nanotechnology
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| Funder | Search for: Ministry of Education, Culture, Sports, Science and Technology; Search for: Natural Sciences and Engineering Research Council of Canada; Search for: National Research Council of Canada |
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| Format | Text, Article |
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| Subject | quantitative transmission electron microscopy (TEM); sample thickness in TEM; plural scattering; bright field TEM; Stobbs factor |
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| Abstract | Bright-field transmission electron microscope (BFTEM) images exhibit spurious image intensity in the vacuum near the sample edge. The spurious intensity gradually decreases with increasing distance from the sample edge. By taking into account angular and energy loss distribution of the scattered electrons and lens aberrations, the origin of the spurious intensity of BFTEM images can be explained. The spurious intensity extent and magnitude can be significantly reduced by using either electron energy filtering or a small collection semiangle. |
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| Publication date | 2022-09-09 |
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| Publisher | Elsevier |
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| In | |
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| Language | English |
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| Peer reviewed | Yes |
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| NRC number | NRC-NANO-232 |
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| Export citation | Export as RIS |
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| Report a correction | Report a correction (opens in a new tab) |
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| Record identifier | 981514c7-d7e3-4ca2-9c72-ddbca26e0537 |
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| Record created | 2022-12-08 |
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| Record modified | 2023-03-16 |
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