| Téléchargement | - Voir la version de l’auteur : Origin of spurious intensity in vacuum near sample edge in bright field TEM images (PDF, 3.3 Mio)
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| DOI | Trouver le DOI : https://doi.org/10.1016/j.micron.2022.103348 |
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| Auteur | Rechercher : Hayashida, Misa1; Rechercher : Malac, Marek1; Rechercher : Yamasaki, Jun |
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| Affiliation | - Conseil national de recherches du Canada. Nanotechnologie
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| Bailleur de fonds | Rechercher : Ministry of Education, Culture, Sports, Science and Technology; Rechercher : Natural Sciences and Engineering Research Council of Canada; Rechercher : National Research Council of Canada |
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| Format | Texte, Article |
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| Sujet | quantitative transmission electron microscopy (TEM); sample thickness in TEM; plural scattering; bright field TEM; Stobbs factor |
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| Résumé | Bright-field transmission electron microscope (BFTEM) images exhibit spurious image intensity in the vacuum near the sample edge. The spurious intensity gradually decreases with increasing distance from the sample edge. By taking into account angular and energy loss distribution of the scattered electrons and lens aberrations, the origin of the spurious intensity of BFTEM images can be explained. The spurious intensity extent and magnitude can be significantly reduced by using either electron energy filtering or a small collection semiangle. |
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| Date de publication | 2022-09-09 |
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| Maison d’édition | Elsevier |
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| Dans | |
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| Langue | anglais |
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| Publications évaluées par des pairs | Oui |
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| Numéro du CNRC | NRC-NANO-232 |
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| Exporter la notice | Exporter en format RIS |
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| Signaler une correction | Signaler une correction (s'ouvre dans un nouvel onglet) |
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| Identificateur de l’enregistrement | 981514c7-d7e3-4ca2-9c72-ddbca26e0537 |
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| Enregistrement créé | 2022-12-08 |
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| Enregistrement modifié | 2023-03-16 |
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