Author | Search for: Hussey, R.; Search for: Sproule, G1; Search for: McCaffrey, John2; Search for: Driad, R.; Search for: Poole, Philip1; Search for: Landheer, Dolf1; Search for: Graham, Michael1; Search for: Springthorpe, Anthony1; Search for: Pakes, A.; Search for: Echeverria, F.; Search for: Skeldon, P.; Search for: Thompson, G. |
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Affiliation | - National Research Council of Canada. NRC Institute for Microstructural Sciences
- National Research Council of Canada. NRC Institute for National Measurement Standards
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Format | Text, Article |
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Conference | Oxide Films Symposium, 197th Meeting of the Electrochem Soc, May 2000, Toronto |
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NPARC number | 12346690 |
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Export citation | Export as RIS |
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Report a correction | Report a correction (opens in a new tab) |
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Record identifier | 9d0555b2-36cc-4953-8ef2-c26e8b8fbc9b |
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Record created | 2009-09-17 |
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Record modified | 2020-04-16 |
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