| DOI | Resolve DOI: https://doi.org/10.1016/j.ultramic.2006.05.001 |
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| Author | Search for: Malac, Marek1; Search for: Beleggia, Marco; Search for: Egerton, Ray; Search for: Zhu, Yimei |
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| Affiliation | - National Research Council of Canada. National Institute for Nanotechnology
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| Format | Text, Article |
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| Subject | bright-field TEM; field-emission source; high-resolution TEM; low-dose imaging; radiation damage; single molecule imaging; spherical aberration |
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| Abstract | We examine the suitability of spherical aberration (CS)-corrected (CS) and uncorrected (UC) transmission electron microscopes (TEM) for conventional bright-field imaging of radiation-sensitive materials. We have chosen an individual molecule suspended in vacuum as a hypothetical example of a well-defined radiation-sensitive sample. We find that for this particular sample, CS instruments provide about 30% improvement over an UC instrument in terms of signal/noise ratio per unit electron dose at 300?kV. The lowest imaging doses can be achieved in CS instruments equipped with high-brightness electron source operated at low incident electron energies. Our calculations suggest that it may be possible to image individual, iodine- or bromine-substituted organic molecules in bright-field mode, at doses lower than the accepted values for radiation damage of aromatic molecules. |
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| Publication date | 2007-01 |
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| In | |
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| Language | English |
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| Peer reviewed | Yes |
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| NPARC number | 12328075 |
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| Export citation | Export as RIS |
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| Report a correction | Report a correction (opens in a new tab) |
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| Record identifier | a327edcc-68fd-465b-8fee-cad77f726ea3 |
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| Record created | 2009-09-10 |
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| Record modified | 2020-05-10 |
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