DOI | Trouver le DOI : https://doi.org/10.1016/j.ultramic.2006.05.001 |
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Auteur | Rechercher : Malac, Marek1; Rechercher : Beleggia, Marco; Rechercher : Egerton, Ray; Rechercher : Zhu, Yimei |
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Affiliation | - Conseil national de recherches du Canada. Institut national de nanotechnologie
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Format | Texte, Article |
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Sujet | bright-field TEM; field-emission source; high-resolution TEM; low-dose imaging; radiation damage; single molecule imaging; spherical aberration |
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Résumé | We examine the suitability of spherical aberration (CS)-corrected (CS) and uncorrected (UC) transmission electron microscopes (TEM) for conventional bright-field imaging of radiation-sensitive materials. We have chosen an individual molecule suspended in vacuum as a hypothetical example of a well-defined radiation-sensitive sample. We find that for this particular sample, CS instruments provide about 30% improvement over an UC instrument in terms of signal/noise ratio per unit electron dose at 300?kV. The lowest imaging doses can be achieved in CS instruments equipped with high-brightness electron source operated at low incident electron energies. Our calculations suggest that it may be possible to image individual, iodine- or bromine-substituted organic molecules in bright-field mode, at doses lower than the accepted values for radiation damage of aromatic molecules. |
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Date de publication | 2007-01 |
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Dans | |
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Langue | anglais |
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Publications évaluées par des pairs | Oui |
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Numéro NPARC | 12328075 |
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Exporter la notice | Exporter en format RIS |
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Signaler une correction | Signaler une correction (s'ouvre dans un nouvel onglet) |
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Identificateur de l’enregistrement | a327edcc-68fd-465b-8fee-cad77f726ea3 |
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Enregistrement créé | 2009-09-10 |
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Enregistrement modifié | 2020-05-10 |
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