| DOI | Resolve DOI: https://doi.org/10.1063/1.4817758 |
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| Author | Search for: Mnaymneh, K.; Search for: Dalacu, D.1; Search for: Poole, P. J.1; Search for: Williams, R. L.2 |
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| Affiliation | - National Research Council of Canada. Information and Communication Technologies
- National Research Council of Canada. Security and Disruptive Technologies
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| Format | Text, Article |
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| Subject | Computational studies; Emission spectrums; InAs/InP quantum dots; Pseudopotential calculation; Quantum information systems; Self assembled quantum dots; Single-photon source; Stress sensitive; Emission spectroscopy; Quantum optics; Semiconductor quantum dots |
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| Abstract | We perform an experimental and computational study of the effects of external stress and intermixing on single site-selected InAs/InP quantum dots in a highly scalable stress-sensitive environment. While such effects are well known for their ability to tune emission spectra, little is known on how they influence emission shell spacing, electron-hole effective mass renormalization, and the physical size of the embedded quantum dot, which are all important parameters affecting the intended functionality. We show excellent agreement between experiment and finite-element solutions of the coupled Navier and Schrödinger equations, including recent atomistic pseudopotential calculations in the literature. These results indicate that using single self-assembled quantum dots in highly scalable, stress-sensitive settings as active elements in future bottom-up nanosystems offers greater versatility to not only quantum information systems where they serve as scalable single-photon sources but also to ultra-sensing capabilities in future nano-electro-mechanical architectures. |
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| Publication date | 2013-08-05 |
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| In | |
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| Language | English |
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| Peer reviewed | Yes |
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| NPARC number | 21270367 |
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| Export citation | Export as RIS |
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| Report a correction | Report a correction (opens in a new tab) |
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| Record identifier | ab62bf39-7df5-48f8-b14b-cc7472589bcb |
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| Record created | 2014-02-05 |
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| Record modified | 2020-04-22 |
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