A high resolution analytical transmission electron microscope optimized for quantitative characterization of radiation sensitive materials
A high resolution analytical transmission electron microscope optimized for quantitative characterization of radiation sensitive materials
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Format | Text, Article |
Publication date | 2007 |
In | |
Language | English |
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Record identifier | ad09a535-60e1-481c-bff6-d08725a1b141 |
Record created | 2021-09-20 |
Record modified | 2021-09-20 |
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