A high resolution analytical transmission electron microscope optimized for quantitative characterization of radiation sensitive materials
A high resolution analytical transmission electron microscope optimized for quantitative characterization of radiation sensitive materials
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| Format | Text, Article |
| Publication date | 2007 |
| In | |
| Language | English |
| Export citation | Export as RIS |
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| Record identifier | ad09a535-60e1-481c-bff6-d08725a1b141 |
| Record created | 2021-09-20 |
| Record modified | 2021-09-20 |
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