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| DOI | Resolve DOI: https://doi.org/10.1088/1361-6528/acbf58 |
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| Author | Search for: Bu, Tianjia; Search for: Gao, Huifang; Search for: Yao, Yaxuan; Search for: Wang, Jianfeng; Search for: Pollard, Andrew J.ORCID identifier: https://orcid.org/0000-0002-6841-2592; Search for: Legge, Elizabeth J.; Search for: Clifford, Charles A.; Search for: Delvallée, AlexandraORCID identifier: https://orcid.org/0000-0002-8908-0742; Search for: Ducourtieux, SébastienORCID identifier: https://orcid.org/0000-0003-4427-433X; Search for: Lawn, Malcolm A.; Search for: Babic, BakirORCID identifier: https://orcid.org/0000-0002-7869-1898; Search for: Coleman, Victoria A.ORCID identifier: https://orcid.org/0000-0002-4630-3803; Search for: Jämting, Åsa; Search for: Zou, Shan1; Search for: Chen, Maohui1; Search for: Jakubek, Zygmunt J.1ORCID identifier: https://orcid.org/0000-0003-3307-8464; Search for: Iacob, Erica; Search for: Chanthawong, Narin; Search for: Mongkolsuttirat, KittiSun; Search for: Zeng, Guanghong; Search for: Almeida, Clara Muniz; Search for: He, Bo-Ching; Search for: Hyde, Lachlan; Search for: Ren, LinglingORCID identifier: https://orcid.org/0000-0002-9804-7303 |
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| Affiliation | - National Research Council of Canada. Metrology Research Centre
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| Funder | Search for: National Measurement System (NMS) of the Department for Business, Energy and Industrial Strategy (BEIS), UK; Search for: Ministry of Science and Technology of the People’s Republic of China |
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| Format | Text, Article |
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| Subject | graphene oxide; atomic force microscopy (AFM); thickness; histogram method; interlaboratory comparison; uncertainty evaluation |
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| Abstract | Flake thickness is one of the defining properties of graphene-related 2D materials (GR2Ms), and therefore requires reliable, accurate, and reproducible measurements with well-understood uncertainties. This is needed regardless of the production method or manufacturer because it is important for all GR2M products to be globally comparable. An international interlaboratory comparison on thickness measurements of graphene oxide flakes using atomic force microscopy has been completed in technical working area 41 of versailles project on advanced materials and standards. Twelve laboratories participated in the comparison project, led by NIM, China, to improve the equivalence of thickness measurement for two-dimensional flakes. The measurement methods, uncertainty evaluation and a comparison of the results and analysis are reported in this manuscript. The data and results of this project will be directly used to support the development of an ISO standard. |
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| Publication date | 2023-03-16 |
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| Publisher | IOP Publishing |
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| Language | English |
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| Peer reviewed | Yes |
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| Export citation | Export as RIS |
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| Report a correction | Report a correction (opens in a new tab) |
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| Record identifier | b0a9e487-d862-4c67-8242-a765aa25b77d |
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| Record created | 2023-04-03 |
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| Record modified | 2023-04-18 |
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