| Téléchargement | - Voir la version finale : Thickness measurements of graphene oxide flakes using atomic force microscopy: results of an international interlaboratory comparison (PDF, 1.8 Mio)
- Voir les données supplémentaires : Thickness measurements of graphene oxide flakes using atomic force microscopy: results of an international interlaboratory comparison (PDF, 216 Kio)
|
|---|
| DOI | Trouver le DOI : https://doi.org/10.1088/1361-6528/acbf58 |
|---|
| Auteur | Rechercher : Bu, Tianjia; Rechercher : Gao, Huifang; Rechercher : Yao, Yaxuan; Rechercher : Wang, Jianfeng; Rechercher : Pollard, Andrew J.Identifiant ORCID : https://orcid.org/0000-0002-6841-2592; Rechercher : Legge, Elizabeth J.; Rechercher : Clifford, Charles A.; Rechercher : Delvallée, AlexandraIdentifiant ORCID : https://orcid.org/0000-0002-8908-0742; Rechercher : Ducourtieux, SébastienIdentifiant ORCID : https://orcid.org/0000-0003-4427-433X; Rechercher : Lawn, Malcolm A.; Rechercher : Babic, BakirIdentifiant ORCID : https://orcid.org/0000-0002-7869-1898; Rechercher : Coleman, Victoria A.Identifiant ORCID : https://orcid.org/0000-0002-4630-3803; Rechercher : Jämting, Åsa; Rechercher : Zou, Shan1; Rechercher : Chen, Maohui1; Rechercher : Jakubek, Zygmunt J.1Identifiant ORCID : https://orcid.org/0000-0003-3307-8464; Rechercher : Iacob, Erica; Rechercher : Chanthawong, Narin; Rechercher : Mongkolsuttirat, KittiSun; Rechercher : Zeng, Guanghong; Rechercher : Almeida, Clara Muniz; Rechercher : He, Bo-Ching; Rechercher : Hyde, Lachlan; Rechercher : Ren, LinglingIdentifiant ORCID : https://orcid.org/0000-0002-9804-7303 |
|---|
| Affiliation | - Conseil national de recherches du Canada. Centre de recherche en métrologie
|
|---|
| Bailleur de fonds | Rechercher : National Measurement System (NMS) of the Department for Business, Energy and Industrial Strategy (BEIS), UK; Rechercher : Ministry of Science and Technology of the People’s Republic of China |
|---|
| Format | Texte, Article |
|---|
| Sujet | graphene oxide; atomic force microscopy (AFM); thickness; histogram method; interlaboratory comparison; uncertainty evaluation |
|---|
| Résumé | Flake thickness is one of the defining properties of graphene-related 2D materials (GR2Ms), and therefore requires reliable, accurate, and reproducible measurements with well-understood uncertainties. This is needed regardless of the production method or manufacturer because it is important for all GR2M products to be globally comparable. An international interlaboratory comparison on thickness measurements of graphene oxide flakes using atomic force microscopy has been completed in technical working area 41 of versailles project on advanced materials and standards. Twelve laboratories participated in the comparison project, led by NIM, China, to improve the equivalence of thickness measurement for two-dimensional flakes. The measurement methods, uncertainty evaluation and a comparison of the results and analysis are reported in this manuscript. The data and results of this project will be directly used to support the development of an ISO standard. |
|---|
| Date de publication | 2023-03-16 |
|---|
| Maison d’édition | IOP Publishing |
|---|
| Licence | |
|---|
| Dans | |
|---|
| Langue | anglais |
|---|
| Publications évaluées par des pairs | Oui |
|---|
| Exporter la notice | Exporter en format RIS |
|---|
| Signaler une correction | Signaler une correction (s'ouvre dans un nouvel onglet) |
|---|
| Identificateur de l’enregistrement | b0a9e487-d862-4c67-8242-a765aa25b77d |
|---|
| Enregistrement créé | 2023-04-03 |
|---|
| Enregistrement modifié | 2023-04-18 |
|---|
