| Download | - View final version: All-electronic nanosecond-resolved scanning tunneling microscopy: facilitating the investigation of single dopant charge dynamics (PDF, 1.1 MiB)
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| Author | Search for: Rashidi, Mohammad1; Search for: Vine, Wyatt1; Search for: Burgess, Jacob A. J.1; Search for: Taucer, Marco2; Search for: Achal, Roshan1; Search for: Pitters, Jason L.1; Search for: Loth, Sebastian; Search for: Wolkow, Robert A.1 |
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| Affiliation | - National Research Council of Canada. National Institute for Nanotechnology
- National Research Council of Canada. Security and Disruptive Technologies
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| Format | Text, Article |
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| Abstract | The miniaturization of semiconductor devices to the scales where small numbers of dopants can control device properties requires the development of new techniques capable of characterizing their dynamics. Investigating single dopants requires sub-nanometer spatial resolution which motivates the use of scanning tunneling microscopy (STM), however, conventional STM is limited to millisecond temporal resolution. Several methods have been developed to overcome this shortcoming. Among them is all-electronic time-resolved STM, which is used in this work to study dopant dynamics in silicon with nanosecond resolution. The methods presented here are widely accessible and allow for local measurement of a wide variety of dynamics at the atomic scale. A novel time-resolved scanning tunneling spectroscopy technique is presented and used to efficiently search for dynamics. |
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| Publication date | 2017-06-27 |
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| Publisher | Cornell University Library |
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| Language | English |
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| Peer reviewed | No |
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| NPARC number | 23002378 |
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| Export citation | Export as RIS |
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| Report a correction | Report a correction (opens in a new tab) |
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| Record identifier | b370cdc9-0ae9-47f0-9a4e-00fed9191f84 |
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| Record created | 2017-10-25 |
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| Record modified | 2020-05-30 |
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