| Téléchargement | - Voir la version finale : All-electronic nanosecond-resolved scanning tunneling microscopy: facilitating the investigation of single dopant charge dynamics (PDF, 1.1 Mio)
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| Auteur | Rechercher : Rashidi, Mohammad1; Rechercher : Vine, Wyatt1; Rechercher : Burgess, Jacob A. J.1; Rechercher : Taucer, Marco2; Rechercher : Achal, Roshan1; Rechercher : Pitters, Jason L.1; Rechercher : Loth, Sebastian; Rechercher : Wolkow, Robert A.1 |
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| Affiliation | - Conseil national de recherches du Canada. Institut national de nanotechnologie
- Conseil national de recherches du Canada. Technologies de sécurité et de rupture
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| Format | Texte, Article |
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| Résumé | The miniaturization of semiconductor devices to the scales where small numbers of dopants can control device properties requires the development of new techniques capable of characterizing their dynamics. Investigating single dopants requires sub-nanometer spatial resolution which motivates the use of scanning tunneling microscopy (STM), however, conventional STM is limited to millisecond temporal resolution. Several methods have been developed to overcome this shortcoming. Among them is all-electronic time-resolved STM, which is used in this work to study dopant dynamics in silicon with nanosecond resolution. The methods presented here are widely accessible and allow for local measurement of a wide variety of dynamics at the atomic scale. A novel time-resolved scanning tunneling spectroscopy technique is presented and used to efficiently search for dynamics. |
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| Date de publication | 2017-06-27 |
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| Maison d’édition | Cornell University Library |
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| Dans | |
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| Autre format | |
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| Langue | anglais |
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| Publications évaluées par des pairs | Non |
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| Numéro NPARC | 23002378 |
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| Exporter la notice | Exporter en format RIS |
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| Signaler une correction | Signaler une correction (s'ouvre dans un nouvel onglet) |
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| Identificateur de l’enregistrement | b370cdc9-0ae9-47f0-9a4e-00fed9191f84 |
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| Enregistrement créé | 2017-10-25 |
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| Enregistrement modifié | 2020-05-30 |
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