Experimental determination of Auger capture coefficients in InAs/GaAs self-assembled dots
Experimental determination of Auger capture coefficients in InAs/GaAs self-assembled dots
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Affiliation |
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Format | Text, Address |
Conference | ICPS25: 25th International Conference on the Physics of Semiconductors, 17-22 September 2000, Osaka, Japan |
Note | This presentation is not published in "Proceedings of the 25th International conference on the physics of semiconductors Part I" |
NPARC number | 12346771 |
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Record identifier | b57d6e1b-927b-4f6e-88a2-19c014bfd0e7 |
Record created | 2009-09-17 |
Record modified | 2020-03-03 |
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