Evaluating long-term stability and transient disturbances of a TEM
Evaluating long-term stability and transient disturbances of a TEM
| DOI | Resolve DOI: https://doi.org/10.1017/S1431927613008003 |
|---|---|
| Author | Search for: 1; Search for: 1; Search for: ; Search for: 1; Search for: |
| Affiliation |
|
| Format | Text, Article |
| Conference | Microscopy and Microanalysis 2013, August 4-8, 2013, Indianapolis, Indiana, USA |
| Publication date | 2013-10-09 |
| Publisher | Cambridge University Press |
| In | |
| Language | English |
| Peer reviewed | Yes |
| Export citation | Export as RIS |
| Report a correction | Report a correction (opens in a new tab) |
| Record identifier | b718c169-1cf9-4b46-8523-4379477149ec |
| Record created | 2020-02-29 |
| Record modified | 2020-04-22 |
- Date modified: