Evaluating long-term stability and transient disturbances of a TEM
Evaluating long-term stability and transient disturbances of a TEM
DOI | Resolve DOI: https://doi.org/10.1017/S1431927613008003 |
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Author | Search for: 1; Search for: 1; Search for: ; Search for: 1; Search for: |
Affiliation |
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Format | Text, Article |
Conference | Microscopy and Microanalysis 2013, August 4-8, 2013, Indianapolis, Indiana, USA |
Publication date | 2013-10-09 |
Publisher | Cambridge University Press |
In | |
Language | English |
Peer reviewed | Yes |
Export citation | Export as RIS |
Report a correction | Report a correction (opens in a new tab) |
Record identifier | b718c169-1cf9-4b46-8523-4379477149ec |
Record created | 2020-02-29 |
Record modified | 2020-04-22 |
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