Second-order susceptibility measurement of thin films by reflective second harmonic generation method - toward measurement standards in nonlinear optics
Second-order susceptibility measurement of thin films by reflective second harmonic generation method - toward measurement standards in nonlinear optics
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Format | Text, Article |
Publication date | 2004 |
Series | |
Language | English |
Peer reviewed | Yes |
NPARC number | 12346795 |
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Record identifier | cbb8486d-ce57-4890-84ed-51fde66ba6b5 |
Record created | 2009-09-17 |
Record modified | 2023-06-22 |
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